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Ferdinand Braun Institute Places Order for the Accel-RF High Power RF Reliability Test System

Tuesday, July 01, 2008

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POWAY, Calif.--(BUSINESS WIRE)--Accel-RF announces an order from the Ferdinand Braun Institute in Berlin, Germany for the new High Power Reliability (HiPR) RF Test System for GaN Devices.

The Ferdinand Braun Institute, a leading GaN developer in Berlin, has chosen the HiPR RF Test System to provide a measurement-based reliability assessment of their GaN technology and end-use devices. The Ferdinand Braun Institute is a leader in the coalition of companies teaming up to produce high power GaN devices for military, space, and commercial markets in Europe. “We have already been contacted by other member companies,” says Roland Shaw, president of Accel-RF Corporation, “and expect a high level of interest to “standardize” on the Accel-RF High Power System for Reliability Testing.”

GaN developers in the United Stated initially evaluated intrinsic reliability issues using discrete devices operating at a fraction of use-application power levels. Some European manufacturers have leveraged the lessons learned on these “small-cell” devices and are moving more rapidly to reliability testing on multi-stage, high power, application-specific devices. “We are happy to be able to provide leading-edge equipment to the European community for high power GaN device reliability testing,” says Shaw, “and we are getting significant interest from US manufacturers as well as they move into this reliability-testing space.” The HiPR RF Test System can test intrinsic reliability of high power discrete devices and MMICs, as well as traditional technology-characterization structures. The system can also be configured for testing applications such as pulsed-power amplifiers used in military electronics and MEMS RF switch devices used in communications and sensor systems.

Accel-RF’s product line of RF Reliability test systems can stress multiple devices simultaneously and independently with DC, thermal, and RF stress up to 18 GHz, at base-plate temperatures greater than 250^oC and bias levels requiring up to 100V and 4Amps. These test instruments are available immediately with standard and custom features.

About Accel-RF

Accel-RF Corporation is a closely-held private corporation located in San Diego, California. The company specializes in the development, design, and production of accelerated life-test/burn-in test systems for RF semiconductor devices. These systems are turn-key integrated instruments that provide a cost-effective and high-value proposition for manufacturers, fabless designers, testing-service providers, original equipment manufacturers, system integrators, and research and development laboratories requiring intrinsic reliability identification, process-control validation, specification standard-deviation characterization, and product qualification testing.

Accel-RF Corporation

11870 Community Road

Suite 200B

Poway, CA 92064

858-332-0707

www.accelrf.com

Source: BUSINESS WIRE